HOME > Article > DetailAuger Electron Spectroscopy: A Rational Method for Determining Thickness of Graphene FilmsMingsheng Xu, Daisuke Fujita, Jianhua Gao, Nobutaka Hanagata. ACS Nano 4 [5] 2937-2945. 2010.https://doi.org/10.1021/nn100276w NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:06:38 +0900Updated at: 2024-05-03 10:39:00 +0900
