Transmission electron microscopy and high-resolusion transmission electron microscopy study of nanostructure and metastable phase evolution in pulsed-laser-ablation-deposited Ti-Si thin film | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Transmission electron microscopy and high-resolusion transmission electron microscopy study of nanostructure and metastable phase evolution in pulsed-laser-ablation-deposited Ti-Si thin film

S. Bysakh, K. Mitsuishi, M. Song, K. Furuya, K. Chattopadhyay.

Journal of Materials Research 19 [04] 1118-1125. 2004.

https://doi.org/10.1557/jmr.2004.0145

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作成時刻: 2016-05-24 14:33:09 +0900 更新時刻: 2025-04-14 06:17:58 +0900

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