HOME > 論文 > 書誌詳細Soft Probe Electrical Contact: Eliminating Electrode Deposition and Enabling Reliable Measurements of Emerging MaterialsMichiko Yoshitake, Kentaro Kinoshita, Hiroki Matsuo, Seiji Sakai, Songtian Li. Materials 19 [13] 2738. 2026.https://doi.org/10.3390/ma19132738 Open Access MDPI AG (Publisher) NIMS著者吉武 道子Materials Data Repository (MDR)上の本文・データセット作成時刻: 2026-07-11 03:05:49 +0900 更新時刻: 2026-10-15 04:36:46 +0900
