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Soft Probe Electrical Contact: Eliminating Electrode Deposition and Enabling Reliable Measurements of Emerging Materials

Michiko Yoshitake, Kentaro Kinoshita, Hiroki Matsuo, Seiji Sakai, Songtian Li.

Materials 19 [13] 2738. 2026.

https://doi.org/10.3390/ma19132738

Open Access MDPI AG (Publisher)

NIMS author(s)

YOSHITAKE, Michiko

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2026-07-11 03:05:49 +0900 Updated at: 2026-10-15 04:36:46 +0900

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