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NIMS Award Symposium 2026

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Electron Excitation Memory Induced by Light Irradiation of Hydrogenated Si Nanocrystals Embedded in SiO2
(SiO2中に埋め込まれた水素化Siナノ結晶の光誘起電子励起メモリー効果)

Kouichi Murakami, Ayako Nagahashi, Noriyuki Uchida, Naoki Fukata.

NIMS author(s)


    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2016-05-24 17:26:11 +0900 Updated at: 2026-10-08 04:43:07 +0900

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