Stability of two-dimensional skyrmions in thin films of Mn1-xFexSi investigated by the topological Hall effect

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Stability of two-dimensional skyrmions in thin films of Mn1−xFexSi investigated by the topological Hall effect
(Stability of two-dimensional skyrmions in thin films of Mn1-xFexSi investigated by the topological Hall effect)

T. Yokouchi, N. Kanazawa, A. Tsukazaki, Y. Kozuka, M. Kawasaki, M. Ichikawa, F. Kagawa, Y. Tokura.

Physical Review B 89 [6] 064416. 2014.

作成時刻: 2023-06-27 21:08:58 +0900 更新時刻: 2026-10-08 08:37:43 +0900