Stability of two-dimensional skyrmions in thin films of Mn<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mrow /><mml:mrow><mml:mn>1</mml:mn><mml:mo>−</mml:mo><mml:mi>x</mml:mi></mml:mrow></mml:msub></mml:math>Fe<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mrow /><mml:mi>x</mml:mi></mml:msub></mml:math>Si investigated by the topological Hall effect

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Stability of two-dimensional skyrmions in thin films of Mn1−xFexSi investigated by the topological Hall effect
(Stability of two-dimensional skyrmions in thin films of Mn1-xFexSi investigated by the topological Hall effect)

T. Yokouchi, N. Kanazawa, A. Tsukazaki, Y. Kozuka, M. Kawasaki, M. Ichikawa, F. Kagawa, Y. Tokura.

Physical Review B 89 [6] 064416. 2014.

Created at: 2023-06-27 21:08:58 +0900 Updated at: 2026-11-09 08:39:30 +0900