HOME > Article > DetailElectron-beam-induced deposition using a subnanometer-sized probe of high-energy electrons(サブナノメートルプローブを用いた電子線励起蒸着)K. Mitsuishi, M. Shimojo, M. Han, K. Furuya. Applied Physics Letters 83 [10] 2064-2066. 2003.https://doi.org/10.1063/1.1611274 NIMS author(s)MITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:58:29 +0900 Updated at: 2026-10-29 04:32:48 +0900