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エネルギー可変陽電子ビームによるInxGa1-xN薄膜の空孔型欠陥の評価
(Vacancy-type defects in InGaN films probed by using monoenergetic positron beams)

上殿明良, 角谷 正友, 石橋章司, 大島永康, 鈴木 良一.

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    Created at :2017-03-17 07:24:27 +0900 Updated at :2018-12-15 00:40:52 +0900

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