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Multiple-scanning-probe tunneling microscope with nanoscale positional recognition function

著者Seiji Higuchi, Hiromi Kuramochi, Olivier Laurent, Takashi Komatsubara, Shinichi Machida, Masakazu Aono, Kenichi Obori, Tomonobu Nakayama.
掲載誌名Review of Scientific Instruments 81 [7] 073706
出版社AIP Publishing
発表年2010
言語English
DOIhttps://doi.org/10.1063/1.3456990
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