HOME > 論文 > 書誌詳細Multiple-scanning-probe tunneling microscope with nanoscale positional recognition functionSeiji Higuchi, Hiromi Kuramochi, Olivier Laurent, Takashi Komatsubara, Shinichi Machida, Masakazu Aono, Kenichi Obori, Tomonobu Nakayama. Review of Scientific Instruments 81 [7] 073706. 2010.https://doi.org/10.1063/1.3456990 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:08:36 +0900更新時刻: 2024-09-05 09:35:53 +0900
