HOME > Article > DetailMultiple-scanning-probe tunneling microscope with nanoscale positional recognition functionSeiji Higuchi, Hiromi Kuramochi, Olivier Laurent, Takashi Komatsubara, Shinichi Machida, Masakazu Aono, Kenichi Obori, Tomonobu Nakayama. Review of Scientific Instruments 81 [7] 073706. 2010.https://doi.org/10.1063/1.3456990 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:08:36 +0900Updated at: 2024-03-31 18:17:05 +0900
