SAMURAI - NIMS Researchers Database

NIMS Award Symposium 2026

HOME > Article > Detail

Direct observation of the electronic structure of even-layer puckered SnTe monolayer films on graphene

Physical Review B 114 [16] 165408. 2026.

NIMS author(s)


Introduction to new articles

Direct observation of puckered monolayer SnTe electronic structure on graphene

image
Using angle-resolved photoemission spectroscopy, we directly measured the electronic structure of monolayer SnTe grown on graphene. The results show that the monolayer adopts a puckered even-layer structure rather than an ideal square-flat geometry. We also found that graphene influences the in-plane orientation, buckling amplitude, and local interfacial electrostatic environment of SnTe. Comparison with multilayer films further reveals the onset of thickness evolution toward a more bulk-like electronic state.

Fulltext and dataset(s) on Materials Data Repository (MDR)


Created at: 2026-10-01 03:08:29 +0900 Updated at: 2026-10-02 03:08:21 +0900

▲ Go to the top of this page