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In situObservation of Surface Reconstruction of Si(001) with Stress/Strain Field Scanning Probe Microscopy
(In situObservation of Surface Reconstruction of Si(001) with Stress/Strain Field Scanning Probe Microscopy)

Hongxuan Guo, Daisuke Fujita.

NIMS著者


    Materials Data Repository (MDR)上の本文・データセット


      作成時刻: 2016-05-24 16:35:20 +0900更新時刻: 2024-04-02 05:01:33 +0900

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