SAMURAI - NIMS Researchers Database

HOME > 論文 > 書誌詳細

In situObservation of Surface Reconstruction of Si(001) with Stress/Strain Field Scanning Probe Microscopy
(In situObservation of Surface Reconstruction of Si(001) with Stress/Strain Field Scanning Probe Microscopy)

Hongxuan Guo, Daisuke Fujita.
Japanese Journal of Applied Physics 50 [8] 08LB04. 2011.
https://doi.org/10.1143/jjap.50.08lb04

NIMS著者

    Materials Data Repository (MDR)上の本文・データセット

      作成時刻: 2016-05-24 16:35:20 +0900 更新時刻: 2025-06-22 05:01:12 +0900

      ▲ページトップへ移動