HOME > Article > DetailInsight into segregation sites for oxygen impurities at grain boundaries in siliconYutaka Ohno, Jie Ren, Shingo Tanaka, Masanori Kohyama, Koji Inoue, Yasuo Shimizu, Yasuyoshi Nagai, Hideto Yoshida. Applied Physics Express 14 [4] 041003. 2021.https://doi.org/10.35848/1882-0786/abe80d Open Access IOP Publishing (Publisher) NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2021-03-10 03:00:18 +0900 Updated at: 2026-10-30 06:41:07 +0900
