Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy

Xeniya Kozina; Julie Karel; Siham Ouardi; Stanislav Chadov; Gerhard H. Fecher; Claudia Felser; Gregory Stryganyuk; Benjamin Balke; Takayuki Ishikawa; Tetsuya Uemura; Masafumi Yamamoto; Eiji Ikenaga; Shigenori Ueda; Keisuke Kobayashi

doi:10.1103/physrevb.89.125116

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Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy
(Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy)

Xeniya Kozina, Julie Karel, Siham Ouardi, Stanislav Chadov, Gerhard H. Fecher, Claudia Felser, Gregory Stryganyuk, Benjamin Balke, Takayuki Ishikawa, Tetsuya Uemura, Masafumi Yamamoto, Eiji Ikenaga, Shigenori Ueda, Keisuke Kobayashi.

Physical Review B 89 [12] 125116. 2014.

https://doi.org/10.1103/physrevb.89.125116

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上田茂典

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 17:21:11 +0900更新時刻: 2024-04-02 03:25:12 +0900

Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy(Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy
(Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy)