Probing the electronic states of high-TMR off-stoichiometric Co<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mrow /><mml:mn>2</mml:mn></mml:msub></mml:math>MnSi thin films by hard x-ray photoelectron spectroscopy

Xeniya Kozina; Julie Karel; Siham Ouardi; Stanislav Chadov; Gerhard H. Fecher; Claudia Felser; Gregory Stryganyuk; Benjamin Balke; Takayuki Ishikawa; Tetsuya Uemura; Masafumi Yamamoto; Eiji Ikenaga; Shigenori Ueda; Keisuke Kobayashi; Xeniya Kozina; Julie Karel; Siham Ouardi; Stanislav Chadov; Gerhard H. Fecher; Claudia Felser; Gregory Stryganyuk; Benjamin Balke; Takayuki Ishikawa; Tetsuya Uemura; Masafumi Yamamoto; Eiji Ikenaga; Shigenori Ueda; Keisuke Kobayashi

doi:10.1103/physrevb.89.125116

Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy
(Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy)

Xeniya Kozina, Julie Karel, Siham Ouardi, Stanislav Chadov, Gerhard H. Fecher, Claudia Felser, Gregory Stryganyuk, Benjamin Balke, Takayuki Ishikawa, Tetsuya Uemura, Masafumi Yamamoto, Eiji Ikenaga, Shigenori Ueda, Keisuke Kobayashi.

Physical Review B 89 [12] 125116. 2014.

https://doi.org/10.1103/physrevb.89.125116

NIMS author(s)

UEDA, Shigenori

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 17:21:11 +0900Updated at: 2024-04-02 03:25:12 +0900

Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy(Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy
(Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy)