HOME > 論文 > 書誌詳細Developments of scanning probe microscopy with stress/strain fieldsH. X. Guo, D. Fujita. Review of Scientific Instruments 82 [12] 123706. 2011.https://doi.org/10.1063/1.3669526 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:35:36 +0900更新時刻: 2025-01-09 07:18:33 +0900
