HOME > Article > DetailDevelopments of scanning probe microscopy with stress/strain fieldsH. X. Guo, D. Fujita. Review of Scientific Instruments 82 [12] 123706. 2011.https://doi.org/10.1063/1.3669526 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:35:36 +0900Updated at: 2024-09-05 07:27:29 +0900
