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Time-Resolved X-ray Diffraction Measurements of High-Density InAs Quantum Dots on Sb/GaAs Layers and the Suppression of Coalescence by Sb-Irradiated Growth Interruption

Naoki Kakuda, Toshiyuki Kaizu, Masamitu Takahasi, Seiji Fujikawa, Koichi Yamaguchi.

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    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2016-05-24 16:23:22 +0900 Updated at: 2026-10-08 06:41:24 +0900

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