Time-Resolved X-ray Diffraction Measurements of High-Density InAs Quantum Dots on Sb/GaAs Layers and the Suppression of Coalescence by Sb-Irradiated Growth Interruption | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Time-Resolved X-ray Diffraction Measurements of High-Density InAs Quantum Dots on Sb/GaAs Layers and the Suppression of Coalescence by Sb-Irradiated Growth Interruption

Naoki Kakuda, Toshiyuki Kaizu, Masamitu Takahasi, Seiji Fujikawa, Koichi Yamaguchi.

Japanese Journal of Applied Physics 49 [9] 095602. 2010.

https://doi.org/10.1143/jjap.49.095602

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作成時刻: 2016-05-24 16:23:22 +0900 更新時刻: 2025-03-19 04:55:45 +0900

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