X線回折法で表界面・薄膜・ナノ構造で何が分かるか
(Surface, thin film, and nano structural information obtained using x-ray diffraction)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 16:44:14 +0900Updated at: 2024-05-03 11:01:52 +0900