HOME > 論文 > 書誌詳細Characterization of Japan's DEMO Candidate Reinforced Nb3Sn Wires Under Crossover Contact StressNobuya Banno, Toshihisa Asano, Tsuyoshi Yagai, Shinya Kawashima, Masahiro Sugimoto, Satoshi Awaji, Hiroyasu Utoh, Yoshiteru Sakamoto. IEEE Transactions on Applied Superconductivity 34 [5] 8400505. 2024.https://doi.org/10.1109/tasc.2024.3362754 Open Access Institute of Electrical and Electronics Engineers (IEEE) (Publisher) Materials Data Repository (MDR) NIMS著者伴野 信哉Materials Data Repository (MDR)上の本文・データセットMDRavailable Characterization of Japan's DEMO Candidate Reinforced Nb<sub>3</sub>Sn Wires Under Crossover Contact Stress 作成時刻: 2024-04-02 03:14:15 +0900 更新時刻: 2026-10-08 09:02:37 +0900