HOME > 論文 > 書誌詳細An optical test for identifying topological insulator thin filmsJun-ichi Inoue. Optics Express 21 [7] 8564. 2013.https://doi.org/10.1364/oe.21.008564 Open Access The Optical Society (Publisher) NIMS著者井上 純一Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:59:51 +0900更新時刻: 2024-03-29 22:58:36 +0900
