HOME > Article > DetailAn optical test for identifying topological insulator thin filmsJun-ichi Inoue. Optics Express 21 [7] 8564. 2013.https://doi.org/10.1364/oe.21.008564 Open Access The Optical Society (Publisher) NIMS author(s)INOUE, JunichiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:59:51 +0900Updated at: 2024-04-30 05:09:45 +0900
