HOME > 論文 > 書誌詳細Influence of DC Bias on Characteristic X-ray Emission from Al2O3 Targets Bombarded with 30 keV Ga+ IonsJiancun, RAO, HASEGAWA, Akira, Renchao, CHE, TAKEGUCHI, Masaki, FURUYA, Kazuo. SURFACE AND INTERFACE ANALYSIS 1731-1733. 2006.NIMS著者長谷川 明竹口 雅樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-10-21 22:15:30 +0900更新時刻: 2022-10-21 22:15:30 +0900
