HOME > Article > DetailInfluence of DC Bias on Characteristic X-ray Emission from Al2O3 Targets Bombarded with 30 keV Ga+ IonsJiancun, RAO, HASEGAWA, Akira, Renchao, CHE, TAKEGUCHI, Masaki, FURUYA, Kazuo. SURFACE AND INTERFACE ANALYSIS 1731-1733. 2006.NIMS author(s)HASEGAWA, AkiraTAKEGUCHI, MasakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-10-21 22:15:30 +0900Updated at: 2022-10-21 22:15:30 +0900