Morphology and bonding measured from boron-nitride powders and films using near-edge X-ray absorption fine structure | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Morphology and bonding measured from boron-nitride powders and films using near-edge X-ray absorption fine structure

L.J.Terminerllo, A.Chaiken, D.A.Lapiano-Smith, G.L.Doll, 佐藤忠夫.

J.Vacuum Science Technology A 2462. 1994.

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作成時刻: 2022-09-05 10:42:07 +0900 更新時刻: 2022-09-05 10:42:07 +0900

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