Morphology and bonding measured from boron-nitride powders and films using near-edge X-ray absorption fine structure | SAMURAI, NIMS Researchers Directory Service

HOME > Article > Detail

Morphology and bonding measured from boron-nitride powders and films using near-edge X-ray absorption fine structure

L.J.Terminerllo, A.Chaiken, D.A.Lapiano-Smith, G.L.Doll, 佐藤忠夫.

J.Vacuum Science Technology A 2462. 1994.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-09-05 10:42:07 +0900 Updated at: 2022-09-05 10:42:07 +0900

▲ Go to the top of this page