Fabrication of Metal–Oxide–Diamond Field-Effect Transistors with Submicron-Sized Gate Length on Boron-Doped (111) H-Terminated Surfaces Using Electron Beam Evaporated SiO2 and Al2O3
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Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2016-05-24 16:34:13 +0900更新時刻: 2024-04-02 03:09:25 +0900