Precise Scanning Tunneling Microscopy Images of Si(100) Surface Dimers at 4.2 K
(4.2Kで観察されるSi(100)表面ダイマーのSTM像)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 11:53:38 +0900 Updated at: 2026-11-09 07:47:49 +0900