Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3Probed by Resonant X-ray Emission Spectroscopy

Hitoshi Yamaoka; Ignace Jarrige; Naohito Tsujii; Akio Kotani; Jung-Fu Lin; Fuminori Honda; Rikio Settai; Yoshichika Ōnuki; Nozumu Hiraoka; Hirofumi Ishii; Ku-Ding Tsuei; Hitoshi Yamaoka; Ignace Jarrige; Naohito Tsujii; Akio Kotani; Jung-Fu Lin; Fuminori Honda; Rikio Settai; Yoshichika Ōnuki; Nozumu Hiraoka; Hirofumi Ishii; Ku-Ding Tsuei

doi:10.1143/jpsj.80.124701

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Pressure and Temperature Dependences of the Electronic Structure of CeIrSi₃ Probed by Resonant X-ray Emission Spectroscopy
(Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3Probed by Resonant X-ray Emission Spectroscopy)

Hitoshi Yamaoka, Ignace Jarrige, Naohito Tsujii, Akio Kotani, Jung-Fu Lin, Fuminori Honda, Rikio Settai, Yoshichika Ōnuki, Nozumu Hiraoka, Hirofumi Ishii, Ku-Ding Tsuei.

Journal of the Physical Society of Japan 80 [12] 124701. 2011.

https://doi.org/10.1143/jpsj.80.124701

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 16:30:44 +0900 更新時刻: 2026-09-29 07:25:32 +0900

Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3 Probed by Resonant X-ray Emission Spectroscopy(Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3Probed by Resonant X-ray Emission Spectroscopy)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Pressure and Temperature Dependences of the Electronic Structure of CeIrSi₃ Probed by Resonant X-ray Emission Spectroscopy
(Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3Probed by Resonant X-ray Emission Spectroscopy)