Pressure and Temperature Dependences of the Electronic Structure of CeIrSi<sub>3</sub> Probed by Resonant X-ray Emission Spectroscopy

Hitoshi Yamaoka; Ignace Jarrige; Naohito Tsujii; Akio Kotani; Jung-Fu Lin; Fuminori Honda; Rikio Settai; Yoshichika Ōnuki; Nozumu Hiraoka; Hirofumi Ishii; Ku-Ding Tsuei; Hitoshi Yamaoka; Ignace Jarrige; Naohito Tsujii; Akio Kotani; Jung-Fu Lin; Fuminori Honda; Rikio Settai; Yoshichika Ōnuki; Nozumu Hiraoka; Hirofumi Ishii; Ku-Ding Tsuei

doi:10.1143/jpsj.80.124701

Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3 Probed by Resonant X-ray Emission Spectroscopy
(Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3Probed by Resonant X-ray Emission Spectroscopy)

Hitoshi Yamaoka, Ignace Jarrige, Naohito Tsujii, Akio Kotani, Jung-Fu Lin, Fuminori Honda, Rikio Settai, Yoshichika Ōnuki, Nozumu Hiraoka, Hirofumi Ishii, Ku-Ding Tsuei.

Journal of the Physical Society of Japan 80 [12] 124701. 2011.

https://doi.org/10.1143/jpsj.80.124701

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 16:30:44 +0900Updated at: 2024-03-31 14:45:50 +0900

Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3 Probed by Resonant X-ray Emission Spectroscopy(Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3Probed by Resonant X-ray Emission Spectroscopy)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3 Probed by Resonant X-ray Emission Spectroscopy
(Pressure and Temperature Dependences of the Electronic Structure of CeIrSi3Probed by Resonant X-ray Emission Spectroscopy)