Molecular beam epitaxy of single-crystalline bixbyite 
<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mrow><mml:mo>(</mml:mo><mml:msub><mml:mi mathvariant="normal">In</mml:mi><mml:mrow><mml:mn>1</mml:mn><mml:mo>−</mml:mo><mml:mi>x</mml:mi></mml:mrow></mml:msub><mml:mrow><mml:msub><mml:mi mathvariant="normal">Ga</mml:mi><mml:mi>x</mml:mi></mml:msub></mml:mrow><mml:mo>)</mml:mo></mml:mrow><mml:mn>2</mml:mn></mml:msub><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:math>
 films (
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): Structural properties and consequences of compositional inhomogeneity

Alexandra Papadogianni; Charlotte Wouters; Robert Schewski; Johannes Feldl; Jonas Lähnemann; Takahiro Nagata; Elias Kluth; Martin Feneberg; Rüdiger Goldhahn; Manfred Ramsteiner; Martin Albrecht; Oliver Bierwagen

doi:10.1103/physrevmaterials.6.033604

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Molecular beam epitaxy of single-crystalline bixbyite (In1−xGax)2O3 films ( x≤0.18 ): Structural properties and consequences of compositional inhomogeneity

Alexandra Papadogianni, Charlotte Wouters, Robert Schewski, Johannes Feldl, Jonas Lähnemann, Takahiro Nagata, Elias Kluth, Martin Feneberg, Rüdiger Goldhahn, Manfred Ramsteiner, Martin Albrecht, Oliver Bierwagen.

Physical Review Materials 6 [3] 033604. 2022.

https://doi.org/10.1103/physrevmaterials.6.033604

NIMS著者

長田貴弘

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2022-05-27 03:12:11 +0900更新時刻: 2024-03-31 16:39:01 +0900