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SIMS DEPTH PROFILING OF N AND In IN ZnO SINGLE CRYSTAL
(酸化亜鉛単結晶中の窒素のインジウムのSIMSの深さ方向プロファイル)

朴大出, SAKAGUCHI, Isao, 大橋直樹, 菱田俊一, HANEDA, Hajime.

APPLIED SURFACE SCIENCE 359-362. 2003.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-11-15 00:40:22 +0900Updated at: 2022-11-15 00:40:22 +0900

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