Observation of filament formation process of Cu/HfO2/Pt ReRAM structure by hard x-ray photoelectron spectroscopy under bias operation

HOME > 論文 > 書誌詳細

Observation of filament formation process of Cu/HfO₂/Pt ReRAM structure by hard x-ray photoelectron spectroscopy under bias operation
(Observation of filament formation process of Cu/HfO2/Pt ReRAM structure by hard x-ray photoelectron spectroscopy under bias operation)

Takahiro Nagata, Masamitsu Haemori, Yoshiyuki Yamashita, Hideki Yoshikawa, Keisuke Kobayashi, Toyohiro Chikyow.

作成時刻: 2016-05-24 16:39:13 +0900 更新時刻: 2026-10-08 06:44:05 +0900