Observation of filament formation process of Cu/HfO<sub>2</sub>/Pt ReRAM structure by hard x-ray photoelectron spectroscopy under bias operation

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Observation of filament formation process of Cu/HfO₂/Pt ReRAM structure by hard x-ray photoelectron spectroscopy under bias operation
(Observation of filament formation process of Cu/HfO2/Pt ReRAM structure by hard x-ray photoelectron spectroscopy under bias operation)

Takahiro Nagata, Masamitsu Haemori, Yoshiyuki Yamashita, Hideki Yoshikawa, Keisuke Kobayashi, Toyohiro Chikyow.

Created at: 2016-05-24 16:39:13 +0900 Updated at: 2026-10-08 06:44:05 +0900