Observation of filament formation process of Cu/HfO2/Pt ReRAM structure by hard x-ray photoelectron spectroscopy under bias operation
(Observation of filament formation process of Cu/HfO2/Pt ReRAM structure by hard x-ray photoelectron spectroscopy under bias operation)
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Created at: 2016-05-24 16:39:13 +0900Updated at: 2024-04-02 05:01:57 +0900