HOME > 論文 > 書誌詳細Real-time Raman Measurement of Si(Ⅲ) under Low Energy Ar+ Ion Irradiation.中村一隆, K. G. Nakamura, M. Kitajima. Journal of Applied Physics 71 [7] 3645-3647. 1992.https://doi.org/10.1063/1.350900 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 11:33:14 +0900 更新時刻: 2026-11-02 05:13:35 +0900
