HOME > Article > DetailReal-time Raman Measurement of Si(Ⅲ) under Low Energy Ar+ Ion Irradiation.中村一隆, K. G. Nakamura, M. Kitajima. Journal of Applied Physics 71 [7] 3645-3647. 1992.https://doi.org/10.1063/1.350900 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:33:14 +0900Updated at: 2024-04-01 20:26:52 +0900
