HOME > 論文 > 書誌詳細High-Resolution Transmission Electron Microscopy of Modulated Structures and Defects in Bi-Sr-Ca-Cu-O Superconductors Prepared b松井良夫, 竹川俊二, 堀内繁雄, 正田薫, 梅園明弘, 中村幸子, 鶴田忠正. Journal of Electron Microscopy 223-230. 1990.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 10:34:36 +0900 更新時刻: 2022-09-05 10:34:36 +0900
