HOME > 論文 > 書誌詳細Void formation in silica glass induced by thermal oxidation after Zn+ ion implantationN. Umeda, H. Amekura, N. Kishimoto. Vacuum 83 [3] 645-648. 2008.https://doi.org/10.1016/j.vacuum.2008.04.043 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:28:41 +0900 更新時刻: 2026-10-08 07:20:02 +0900
