HOME > 論文 > 書誌詳細Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron MicroscopePeng Wang, Gavin Behan, Masaki Takeguchi, Ayako Hashimoto, Kazutaka Mitsuishi, Masayuki Shimojo, Angus I. Kirkland, Peter D. Nellist. Physical Review Letters 104 [20] 200801. 2010.https://doi.org/10.1103/physrevlett.104.200801 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:03:45 +0900更新時刻: 2024-04-02 05:58:55 +0900
