Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope | SAMURAI, NIMS Researchers Directory Service

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Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope

Peng Wang, Gavin Behan, Masaki Takeguchi, Ayako Hashimoto, Kazutaka Mitsuishi, Masayuki Shimojo, Angus I. Kirkland, Peter D. Nellist.

Physical Review Letters 104 [20] 200801. 2010.

https://doi.org/10.1103/physrevlett.104.200801

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Created at: 2016-05-24 16:03:45 +0900Updated at: 2024-04-02 05:58:55 +0900

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