SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Electron-beam-induced current and cathodoluminescence study of dislocation arrays in 4H-SiC homoepitaxial layers

Bin Chen, Takashi Sekiguchi, Takasumi Ohyanagi, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura.
Journal of Applied Physics 106 [7] 074502. 2009.
https://doi.org/10.1063/1.3236579

NIMS author(s)

    Fulltext and dataset(s) on Materials Data Repository (MDR)

      Created at: 2016-05-24 15:53:38 +0900Updated at: 2024-05-01 09:00:35 +0900

      ▲ Go to the top of this page