HOME > 論文 > 書誌詳細Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force MicroscopyChun Li, Yoshio Bando, Dmitri Golberg. ACS Nano 4 [4] 2422-2428. 2010.https://doi.org/10.1021/nn100223j NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:07:25 +0900更新時刻: 2024-04-02 06:03:51 +0900
