SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy

Chun Li, Yoshio Bando, Dmitri Golberg.
ACS Nano 4 [4] 2422-2428. 2010.

NIMS author(s)


    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2016-05-24 16:07:25 +0900 Updated at: 2025-04-20 05:56:14 +0900

      ▲ Go to the top of this page