Spectral Analysis of Nanomaterials using a Transition-Edge Sensor Microcalorimeter Mounted on a Field-Emission Scanning Electron Microscope | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Spectral Analysis of Nanomaterials using a Transition-Edge Sensor Microcalorimeter Mounted on a Field-Emission Scanning Electron Microscope

Qinghui Li, Yuki Ono, Yoshikazu Homma, Keiichi Tanaka, Yukari Baba, Satoshi Nakayama, Katsutoshi Fukuda, Takayoshi Sasaki, Izumi Nakai.

Japanese Journal of Applied Physics 47 [6] 4835-4838. 2008.

https://doi.org/10.1143/jjap.47.4835

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作成時刻: 2016-05-24 15:46:18 +0900 更新時刻: 2026-10-30 08:48:06 +0900

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