Direct Imaging of Charged Impurity Density in Common Graphene Substrates

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Kristen M. Burson, William G. Cullen, Shaffique Adam, Cory R. Dean, K. Watanabe, T. Taniguchi, Philip Kim, Michael S. Fuhrer.

Nano Letters 13 [8] 3576-3580. 2013.

作成時刻: 2016-05-24 17:26:33 +0900更新時刻: 2024-04-02 03:54:58 +0900