HOME > Article > DetailDirect Imaging of Charged Impurity Density in Common Graphene SubstratesKristen M. Burson, William G. Cullen, Shaffique Adam, Cory R. Dean, K. Watanabe, T. Taniguchi, Philip Kim, Michael S. Fuhrer. Nano Letters 13 [8] 3576-3580. 2013.https://doi.org/10.1021/nl4012529 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 17:26:33 +0900 Updated at: 2026-10-08 05:44:16 +0900
