HOME > 論文 > 書誌詳細Optical and Optoelectronic Property Analysis of Nanomaterials inside Transmission Electron MicroscopeJoseph F. S. Fernando, Chao Zhang, Konstantin L. Firestein, Dmitri Golberg. Small 13 [45] 1701564. 2017.https://doi.org/10.1002/smll.201701564 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-12-16 20:47:00 +0900 更新時刻: 2026-04-23 04:56:27 +0900
