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Optical and Optoelectronic Property Analysis of Nanomaterials inside Transmission Electron Microscope

Joseph F. S. Fernando, Chao Zhang, Konstantin L. Firestein, Dmitri Golberg.
Small 13 [45] 1701564. 2017.
https://doi.org/10.1002/smll.201701564

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    Created at: 2017-12-16 20:47:00 +0900Updated at: 2024-03-29 22:57:26 +0900

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