Three-Dimensional Location of a Single Dopant with Atomic　Precision by Aberration-Corrected Scanning Transmission Electron　Microscopy

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Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy
(Three-Dimensional Location of a Single Dopant with Atomic　Precision by Aberration-Corrected Scanning Transmission Electron　Microscopy)

Ryo Ishikawa, Andrew R. Lupini, Scott D. Findlay, Takashi Taniguchi, Stephen J. Pennycook.

Nano Letters 14 [4] 1903-1908. 2014.

作成時刻: 2016-05-24 17:42:14 +0900更新時刻: 2024-04-02 03:58:14 +0900