Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy
(Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy)
Author(s) | Ryo Ishikawa, Andrew R. Lupini, Scott D. Findlay, Takashi Taniguchi, Stephen J. Pennycook. |
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Journal title | Nano Letters 14 [4] 1903-1908 ISSN: 15306984 ESI category: PHYSICS |
Publisher | American Chemical Society (ACS) |
Year of publication | 2014 |
Language | English |
DOI | https://doi.org/10.1021/nl500564b |
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