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Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy
(Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy)

Author(s)Ryo Ishikawa, Andrew R. Lupini, Scott D. Findlay, Takashi Taniguchi, Stephen J. Pennycook.
Journal titleNano Letters 14 [4] 1903-1908
ISSN: 15306984
ESI category: PHYSICS
PublisherAmerican Chemical Society (ACS)
Year of publication2014
LanguageEnglish
DOIhttps://doi.org/10.1021/nl500564b
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