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Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy
(Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy)

Ryo Ishikawa, Andrew R. Lupini, Scott D. Findlay, Takashi Taniguchi, Stephen J. Pennycook.
Nano Letters 14 [4] 1903-1908. 2014.

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